A novel assay for drug-DNA binding mode, affinity, and exclusion number: scanning force microscopy.

A novel assay for drug-DNA binding mode, affinity, and exclusion number: scanning force microscopy.

Determining the mode-of-binding of a DNA ligand is not always straightforward. Here, we establish a scanning force microscopic assay for mode-of-binding that is (i) direct: lengths of individual DNA-ligand complexes are directly measured; (ii) rapid: there are no requirements for staining or elaborate sample preparation; and (iii) unambiguous: an observed increase in DNA length upon addition of...

Application of Scanning Electron and Atomic Force Mode Microscopy on inscription from Proto-Elamite period in Tappeh Sofalin

The study of cultural heritage artifacts and the research of a protection and restoration intervention create with - and are often limited to - a complete characterization of their surface. This is not only factual for museum objects, but also for archaeological artifacts, because the object as it was discovered may contain precious unknown information that could be lost by too much aggressive ...

Supporting Information for: Structure, mechanics, and binding mode heterogeneity of LEDGF/p75- DNA nucleoprotein complexes revealed by scanning force microscopy

DNA height in scanning force microscopy.

The measured height of DNA molecules adsorbed on a mica substrate by scanning probe microscopy is always less than the theoretical diameter. In this paper we show that, when imaged in ambient conditions, the molecules are usually immersed in the salt layer used to adsorb them to the substrate. This layer distorts the measurement of DNA height and is the main source of error but not the only one...

Scanning impedance microscopy (SIM): A novel approach for AC transport imaging

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...